Application

This SRM is intended for use as a standard for calibration of diffraction line positions and line shapes, determined through powder diffractometry.

Features and Benefits

A unit of SRM 640f consists of approximately 7.5 g of silicon powder bottled under argon. Analysis of X-ray powder diffraction data indicated that the SRM material is homogeneous with respect to diffraction properties. SRM 640f was bottled under argon to protect against humidity. The certification data was analyzed using the FPA method with Pawley refinements as implemented in TOPAS. Expiration details and storage instructions are available in the NIST certificate.

General description

The Standard Reference Material (SRM) was prepared from ultra-high purity, intrinsic silicon boules that were crushed and jet milled to a median particle size of 4.1 µm. The resulting powder was then annealed under gettered argon at 1000 °C for two hours and bottled under argon.SRM 640f_cert SRM 640f _SDS

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology